Intellium™ metrology instruments meet the challenges of wavefront analysis and optical testing by combining simplicity of design and high performance in small form factors that save space. The chart below compares highlights between our products to help select the product that is most suited for your application. Don’t hesitate to call for more details or assistance.
| Feature/Application | Dimetior AS | Dimetior VB | Dimetior PS | Intellium™ Z40 | Intellium™ Z100 |
| UV Wavelengths | |||||
| Visible Wavelengths | |||||
| NIR Wavelengths | |||||
| Phase Shifting | |||||
| Surface Wavefront Characterization | |||||
| Transmitted Wavefront Characterization | |||||
| Source Wavefront Characterization | |||||
| Small Beam Characterization | |||||
| Spheric Optic Testing | |||||
| Aspheric Optic Testing | |||||
| Large Aperture Flats 300mm+ | |||||
| Optical Assembly & Alignment | |||||
| Adaptive Optics | |||||
| Real Time Analysis |